Design For Testability

Design For Testability

Design for testing or Design for Testability (DFT) consists of IC design techniques that add Testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware.

A good practice in DFT during SoC design and verification can improve time to market and reduce manufacturing costs. Our DFT consultancy delivers testable silicon with optimal test time. As part of an outsourced project engagement, or as an embedded member of your design team, we can provide the specialist DFT consulting expertise to meet your target test coverage.

Our Team has expertise in:

  • Scan Insertion
  • Boundary Scan
  • MBIST, LBIST, ATPG
  • Post Silicon Tester Support